ISO 1302 & 21920:2022

An analysis software solution for all your instrument data

Looking for a comprehensive software suite that can handle all your microscope and profile data? Look no further than MountainsLab®. Our industry-standard surface analysis solution is the ideal choice for any type of lab, providing a centralized hub for all your instrument data. With our team's extensive expertise and support, you can trust that your analysis will be successful regardless of your application.
The most comprehensive set of shape and surface texture analysis – Particle and pore analysis – Fiber analysis – Statistical analysis of static and dynamic populations – Force curve and force volume analysis – Features for spectroscopy (Raman, IR, EDS/EDX, cathodoluminescence, etc.) – Color and topography innovation for scanning electron microscopy – Analysis of multichannel tomography cubes of compositional data – And much more

Important analysis functions in MountainsLAB®

Data confluence

Collect data from multiple instruments

  • Speed up analysis by using a single program.
  • Make sure you generate meaningful results from your data
  • Load live documents and analyzes created by other Mountains® users (22,000+ community worldwide).
  • Process data from virtually all types of surface and image analysis instruments (50+ instrument manufacturers provide Mountains®-based software packages with their equipment)

Compatible with all instruments

Process data from:

  • 2D and 3D profilometers
  • light microscopes and other imaging systems that produce monochrome or color images
  • scanning electron microscope (SEM)
  • scanning probe microscopes (SPM) including atomic force microscopes (AFM)
  • spectroscopic techniques (Raman, TERS, IR, nanoIR, fluorescence, photoluminescence, cathodoluminescence, EDX/EDS, XRF, etc.)

Load hundreds of file formats covering:

  • profiles
  • surfaces
  • 3D (tomography) and 2D images
  • multichannel files
  • power curves
  • hyperspectral images
  • multichannel cubes etc.

Correction of measurement data

Get your measurement data ready for analysis and eliminate outliers, local defects and measurement noise.

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